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The completion of the numerous studies done since 1995 enabled us to acquire a thorough know how in the field of optical design from extreme UV to far IR. Stray light analyzes . Tolerancing.
Corresponding publications and other are on the page Downloads
This know how has been presented at the International Conference of Space Optics (Toulouse 2000) and at the SPIE-EOS Optical Design Conference (St Etienne-2003 – SPIE Proceeding N° 5249). Ghost are due to multiple reflections between the optical
surfaces of the lens and between the focal plane and the optical surfaces. The solution to make them less vible consist in modifying curvatures, thicknesses, etc..during the optimization, and this is difficult because other ghost may appear during this process. In it's more complex recent version, it makes possible a complete quantitative prediction taking into account the coatings on the surfaces, and the polarization state. - In the 3-5 microns band, it is now routinely used during the design phase. This is because the contrast is especially high in this spectral range, and the ghosts must be attenuated up to a high level of stray light ratio's - In photolithography, it is used to predict the stray light on the whole wafer. This point is especially important for the machines of the "Steppers" type. In a similar manner, PARASIT has been used to predict the stray light in optical system using diffractive elements, taking into account the several orders of diffraction of the diffractive element. In a similar philosophy, some special tools have been developed to help and make more systematic the analysis of the stray light in general, i.e. taking also the mechanics, etc…For this purpose, LightTools is used together with MATLAB and a special methodology has been defined and MATLAB macros developed.
In every optical study, the question regarding the tolerancing arises and takes a significant part of the time dedicated
to the study. These tools also permit to trace the exact M.T.F. taking into account the tolerances, for comparison with the theoretical curves, and to construct the CODE V files which correspond to the worst case. This new set of CODE V and EXCEL macros which we have called TOLTRI has been presented at the SPIE-EOS conference Optical Design and Engineering in Iéna in September 2005 (SPIE Proceeding N° 5962). It has been completed in 2006 in order to consider also the tolerancing using the TOLFDIF routine of CODE V. Comparing on EXCEL spreadsheets the results obtained with TOR and TOLFDIF is easy because both spreadsheets have the same format. This gives a new and extremely interesting horizon to the question of tolerancing.
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